In this note we give some recurrence relations satisfied by single and product moments of k-th upper record values from the exponential-Weibull lifetime distribution. Using a recurrence relation for single moments we obtain a characterization of exponential-Weibull, Weibull, exponential, Rayleigh and two parameter linear failure rate distributions.
Khan, R., Kulshrestha, A., & Khan, M. (2015). Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization. Journal of the Egyptian Mathematical Society, 23(3), 558-562. doi: 10.1016/j.joems.2014.11.003
MLA
R.U. Khan; A. Kulshrestha; M.A. Khan. "Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization", Journal of the Egyptian Mathematical Society, 23, 3, 2015, 558-562. doi: 10.1016/j.joems.2014.11.003
HARVARD
Khan, R., Kulshrestha, A., Khan, M. (2015). 'Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization', Journal of the Egyptian Mathematical Society, 23(3), pp. 558-562. doi: 10.1016/j.joems.2014.11.003
VANCOUVER
Khan, R., Kulshrestha, A., Khan, M. Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization. Journal of the Egyptian Mathematical Society, 2015; 23(3): 558-562. doi: 10.1016/j.joems.2014.11.003
)
View on SCiNiTO